Testsysteme für Chips in der High-Speed Datenübertragung
Foto- und Laserdioden vor dem Einbau in ein Gehäuse zu testen bedarf spezieller Instrumente wie z. B. dem Bit Error Ratio Test , kurz BERT .
Mittels Augendiagramm wird die Signalqualität des Ergebnisses der Umwandlung von Licht in Strom und damit die Bitfehlerrate gemessen.
www.hhi.fraunhofer.deA Testing System for Chips in High-Speed Data Transmission
Testing photo diodes and laser diodes before they are embedded in housings requires special instruments like the bit error ratio test , or BERT for short .
Eye diagrams are used to measure the signal quality resulting from the transformation of light into electrical power and thus the bit error ratio.
www.hhi.fraunhofer.deA Testing System for Chips in High-Speed Data Transmission
Testing photo diodes and laser diodes before they are embedded in housings requires special instruments like the bit error ratio test , or BERT for short .
Eye diagrams are used to measure the signal quality resulting from the transformation of light into electrical power and thus the bit error ratio.
www.hhi.fraunhofer.deTestsysteme für Chips in der High-Speed Datenübertragung
Foto- und Laserdioden vor dem Einbau in ein Gehäuse zu testen bedarf spezieller Instrumente wie z. B. dem Bit Error Ratio Test , kurz BERT .
Mittels Augendiagramm wird die Signalqualität des Ergebnisses der Umwandlung von Licht in Strom und damit die Bitfehlerrate gemessen.
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